Characterization of thin film solar cells
Together with the IRDEP (Institute of Research and Development on Photovoltaic Energy), the company Photon etc. has developed a PL mapper for the characterization of thin film solar cells.
Photoluminescence processes are often used to detect defects in a layer system at an early stage, such as LEDs, OFETs or solar cells. With these faint processes the Hyperspectral Imager increase efficiency and throughput through its high transmission of up to 80% and detect defects with a spectral resolution of up to 0.3 nm. The location and size of the defect is displayed directly on the array camera via imaging optics. This setup eliminates the need for an xy scanning device, as required by a classic spectrometer. In addition to photoluminescence, electroluminescence and diffuse reflection can also be measured with the same equipment. Whether you want to examine entire cells or just tiny areas, the Hyperspectral Imager can be designed for both macroscopic and microscopic applications.
