NanoCam HD – High-Precision 3D Surface Measurement
The NanoCam HD by 4D Technology is a non-contact optical surface profilometer for high-precision measurement of surface shape, texture, and roughness. The system combines a large measurement area with high vertical resolution, making it particularly suitable for applications where larger optical or technical surfaces need to be characterized quickly and reproducibly.
Unlike tactile measurement methods, the acquisition is completely non-contact. Sensitive, coated, or high-precision surfaces can thus be inspected without mechanically influencing the component.
Dynamic Interferometry® for vibration-insensitive measurements
At the heart of the NanoCam HD is the patented Dynamic Interferometry® Technology from 4D Technology. The phase information required for a complete surface measurement is captured simultaneously instead of requiring multiple sequential exposures.
A measurement can thereby be done in less than 100 microseconds take place. Vibrations, air currents, and other environmental influences have significantly less time to affect the measurement result.
Therefore, the NanoCam HD can also be used outside of a traditional vibration-isolated measurement laboratory – for example, directly in production environments or in automated testing stations.
surface roughness down to the angstrom range
With a vertical resolution up to 1 Å the NanoCam HD enables the quantitative analysis of very small surface structures. In addition to classic roughness measurement, three-dimensional surface topographies can be captured and different areas of a surface can be compared with one another.
The evaluation supports surface parameters according to ISO 25178 and thus enables a standardized quantitative characterization of the measured surfaces.
Large-area measurement without mechanical scanning
A special strength of the NanoCam HD is the combination of high vertical resolution and a comparatively large measurement field. This allows larger areas of a surface to be captured in a single measurement.
This reduces the effort compared to methods in which a surface has to be scanned point by point or line by line, making the system particularly attractive for fast inspection and quality control tasks.
Typical applications
- Roughness measurement of optical surfaces
- 3D surface topography
- Quality control of lenses and mirrors
- Characterization of polished and coated surfaces
- Testing of large and segmented telescope optics
- Semiconductor and wafer inspection
- Precision optics and optical manufacturing
- Materials Science and Surface Engineering
- Production-related process control
- Automated serial testing
Advantages of the NanoCam HD
- Non-contact optical measurement
- Vertical resolution up to 1 Å
- Measurement time under 100 µs
- High insensitivity to vibrations
- Large-area 3D surface measurement
- Quantitative roughness analysis
- Analysis according to ISO 25178
- Suitable for laboratory and manufacturing environments
- Integration into automated measurement processes possible
- Measurement of sensitive surfaces without mechanical contact
Analysis with 4Sight™ Focus
The measurement data are using the 4Sight™ Focus Software captured and evaluated by 4D Technology. In addition to the three-dimensional representation of the surface topography, comprehensive analysis functions for roughness, shape, and surface structure are available.
This allows measurement data to be used for detailed development analyses as well as for reproducible quality controls and automated testing procedures.
Manufacturer
4D Technology develops interferometric measurement systems for the high-precision characterization of surfaces and wavefronts. The patented Dynamic Interferometry® technology enables rapid measurements even under environmental conditions where conventional phase-shifting interferometers are impaired by vibrations or air currents.
