AccuFiz® – Fizeau Interferometer

  • Precise measurement of surface shape and wavefront
  • Fizeau interferometer for optics manufacturing and quality control
  • Wavelengths of visible range to LWIR
  • Aperture priority 150 mm, larger diameters with beam expanders
  • Variants for Phase shift and dynamic measurement
  • Measurement of flat surfaces, spherical optics, and optical systems
  • Comprehensive analysis with 4Sight™ Focus
  • Special configurations for IR, short-coherence, and vibration-critical applications

 

MZ

Michael Zerbin

Laser, Metrology, Spectroscopy


Inspection of planar and spherical surfaces
Static and dynamic analysis
Answer < 1 working day

Precise wavefront and surface measurement with AccuFiz®

The AccuFiz® Fizeau Interferometer from 4D Technology are high-precision measurement systems for interferometric testing of optical surfaces, wavefronts, and complete optical systems. The product family covers an exceptionally wide spectral range from visible light to the long-wave infrared range, making it adaptable to a wide variety of tasks in optics manufacturing, research, and quality assurance.

Depending on the configuration, systems with different laser sources, apertures, cameras, and measurement modes are available. This enables both classic Fizeau measurements with temporal phase shifting and dynamic measurements under demanding environmental conditions.

Measurement of flat surfaces, spheres, and optical systems

The Fizeau principle enables high-precision, non-contact measurements of optical components. Together with suitable reference optics, flat surfaces, spherical surfaces, prisms, as well as transmitting optical components and complete systems, among other things, can be characterized.

As a result, the AccuFiz systems are suitable both for individual measurement stations in research and development and for recurring testing tasks within industrial optics manufacturing.

From the visible spectral range to LWIR

A special strength of the AccuFiz family is the large selection of available measurement wavelengths. Depending on the measurement task, systems are available at 532 nm, 633 nm, 1053 nm, 1550 nm as well as in the MWIR and LWIR range available. This also makes it possible to test optical components at or near their intended operating wavelength.

For special IR applications, configurations up to, for example, are available 10.6 µm available. The AccuFiz LWIR is designed as a complete Fizeau interferometer system for measurements at this wavelength.

Dynamic Interferometry and Short Coherence

For measurement environments with vibrations as well as for special optical components, 4D Technology offers special AccuFiz configurations. Dynamic systems capture the information required for phase determination extremely quickly, thereby reducing the influence of motion and vibration on the measurement result.

The AccuFiz D combines, for example, dynamic interferometry with a short-coherence light source. This allows closely spaced parallel glass surfaces to be examined separately. According to 4D Technology, a complete wavefront measurement can be performed in just 150 µs take place.

This is much more precise than your current phrase „dynamic interferometer for use under vibrating conditions“.

Analyze with 4Sight™ Focus

Data acquisition and evaluation are carried out with the 4Sight™ Focus Wavefront Analysis Software. It supports single, average, burst, and continuous measurements and provides numerous tools for the analysis and display of measured surfaces and wavefronts.

These include, among others 2D and 3D representations as well as Zernike, Seidel, geometric, and further analyses. This allows for both rapid quality checks and detailed investigations of optical components.

Typical applications

  • Inspection of flat surfaces and spherical optics
  • Measurement of surface shape and wavefront
  • Transmission measurement of optical components and systems
  • Testing of IR and SWIR optics
  • Optical manufacturing and quality control
  • Measurement of thin and plane-parallel optics
  • Radius and form measurements
  • Research and Development
  • Measurements in vacuum and climate chambers
  • Applications with increased vibrations or long measurement cavities

Advantages of the AccuFiz® family

  • Fizeau interferometry for high-precision optical measurements
  • Broad wavelength range from visible to LWIR
  • Different apertures and system configurations
  • Expansion to large measuring diameters possible
  • Classic and dynamic measurement methods available
  • Short-coherence systems for thin and parallel optics
  • Comprehensive wavefront analysis with 4Sight™ Focus
  • Systems for laboratory, production, and research
  • Adaptation to special measurement tasks and spectral ranges

Manufacturer

4D Technology develops high-precision interferometric measurement systems for the characterization of optical surfaces and wavefronts. In addition to the AccuFiz® Fizeau interferometers, the portfolio includes dynamic interferometers of the PhaseCam series and systems for non-contact 3D surface measurement.

Models

Model Wavelength camera Stabilized power supply Special features
AccuFiz B100 / B150 633 nm 512 × 512 Base model for standard measurements
AccuFiz E100 / E150 633 nm 1.44 MP Extended Source, optional 6× Zoom
AccuFiz E100S / E150S 633 nm 1.44 MP stabilized laser, extended source
AccuFiz H100S / H150S 633 nm 6 MP High camera resolution
AccuFiz E100-532 / E150-532 532nm 1.44 MP For measurements at 532 nm
AccuFiz S100-1053 / S150-1053 1053 nm 1.44 MP NIR applications
AccuFiz SWIR 1550 nm 512 × 512 Measurements in the SWIR range
AccuFiz MWIR 3.39 / 3.8 µm 480 × 480 MWIR optics, 2× optical zoom
AccuFiz LWIR 10.6 µm 512 × 512 Testing of LWIR optics, 2x optical zoom

Applications

  • Inspection of flat surfaces and spherical optics
  • Measurement of surface shape and wavefront
  • Transmission measurement of optical components and systems
  • Testing of IR and SWIR optics
  • Optical manufacturing and quality control
  • Measurement of thin and plane-parallel optics
  • Radius and form measurements
  • Research and Development
  • Measurements in vacuum and climate chambers
  • Applications with increased vibrations or long measurement cavities
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