OE4000 – Multifunctional characterization of low-noise laser sources
The OE4000 HI-Q® Multifunctional Laser Noise Analyzer by OEwaves enables the high-precision characterization of CW laser sources with regard to Laser linewidth, phase and frequency noise, relative intensity noise (RIN), and frequency stability. This makes it possible to investigate the central spectral and temporal properties of modern narrowband lasers using a single measurement system.
The OE4000 was specially developed for applications where high coherence, narrow linewidth, and low laser noise are critical. The fully automated measurement enables fast and reproducible characterization in research and development as well as in demanding test and measurement tasks.
Homodyne measurement method without reference laser
The OE4000 uses a homodyne measurement method for the analysis of extremely low phase noise of CW laser sources. A major advantage of this method is that no additional low-noise reference laser source is required.
This significantly reduces the experimental effort and also allows laser sources with very narrow linewidths to be conveniently characterized. The evaluation includes both the both the intrinsic and the effective FWHM line width.
Comprehensive analysis of laser noise
In addition to classical line width measurement, the OE4000 enables a much more comprehensive analysis of the laser source. The system can Phase and frequency noise, relative intensity noise, and frequency stability capture and thereby provide important metrics for evaluating highly stable laser sources.
With a frequency resolution of 0.1 Hz to 200 kHz and a noise floor of -160 dBc/Hz at frequencies above 1 MHz the system is suitable for the investigation of particularly low-noise CW lasers.
Wide wavelength range
The OE4000 is available in several configurations for Wavelength ranges between 400 and 2200 nm available. This allows a wide variety of laser sources from the visible to the near-infrared spectral range to be characterized.
The compact 3U 19-inch rack system can be controlled via USB or RS-232 and can also be operated remotely. The combination of automated measurement and user-friendly operation facilitates both individual characterization measurements and use in recurring test procedures.
Typical applications
The OE4000 is particularly suitable for applications where the spectral purity and stability of a laser source are critical:
- Interferometric optical sensing
- LIDAR
- Optical Metrology and Spectroscopy
- Gas sensors
- Acoustic sensors
- Temperature and strain measurement using B-OTDR
- Coherent optical communication
- Research, Development and Test & Measurement
These fields of application are explicitly stated by OEwaves for the HI-Q® test and measurement systems.
Benefits of the OE4000
- Measurement of laser linewidth and phase/frequency noise
- Intrinsic and effective FWHM line width analysis
- RIN and frequency stability measurement
- No low-noise reference laser source required
- Multiple wavelength ranges between 400 and 2200 nm
- Fast real-time measurement
- Remote work possible
- Compact 3U/19-inch rack system
OE4000 from OEwaves
The OE4000 HI-Q® Multifunctional Laser Noise Analyzer combines several important methods for characterizing highly stable laser sources in one system. This makes it particularly suitable for applications where, in addition to the pure laser linewidth, also Phase noise, frequency noise, intensity noise and long-term stability must be evaluated.
Soliton assists you in selecting the appropriate OE4000 configuration for your laser source and the required wavelength range.
