The Nano Cam HD is a high-precision dynamic profilometer specifically designed for measuring the surface roughness of large, polished optics. With its patented Dynamic Interferometry® technology, it delivers not only fast and reliable, but also repeatable measurements at sub-angstrom levels, even in demanding production environments.
In addition, the device can be flexibly mounted by hand, on a robot arm or in a production facility and can therefore be individually adapted to the respective requirements. Thanks to the patented Dynamic Interferometry® technology, the measurements are also insensitive to vibrations even in demanding environments and are therefore always reliable.
The comprehensive 4Sight Focus™ analysis software also offers an intuitive user interface for rapid data acquisition and analysis in accordance with ISO 25178. Various lenses also allow the magnification to be individually adjusted to specific requirements.
With an impressive measurement time of less than 100 microseconds, the NanoCam HD is not only several thousand times faster than conventional profilometers, but also optimizes quality control in optics production. The high precision, speed and reliability make the NanoCam HD an indispensable tool for surface measurement of large optics.
