Wavefront camera - High Res

  • Simultaneous phase and intensity measurement
  • Spectral range 400-900 nm
  • High-resolution CMOS sensor
  • Integration via C/CS mount
  • USB 3.0 + external trigger
MZ

Michael Zerbin

Laser, Metrology, Spectroscopy


Precise phase imaging with the wavefront camera – High Res

The TIKEI Cam by Silios is a high-performance Wavefront camera - High Res, which was specifically developed for quantitative phase imaging (QPI) and detailed optical wavefront analysis. This camera sets standards in the characterization of optical systems for scientific and industrial applications.

Through the innovative combination of a high-resolution CMOS sensor with a micro-optical structure, the Wavefront camera - High Res Intensity and wavefront information simultaneously. Since this process occurs within a single recording cycle (single-shot), even dynamic samples can be precisely analyzed without time loss.

Advantages of the Wavefront Camera – High Resolution in Application

The working range of this high-resolution solution lies in the visible spectral range from 400 nm to 900 nm. Thanks to the particularly fine pixel structure, it enables Wavefront camera - High Res extremely high spatial resolution and highly precise reconstruction of the wavefront phase.

Typical applications are

  • quantitative phase microscopy (QPI)

  • Cell and biosample analysis

  • Material characterization

  • Nanophotonics

  • Optical system diagnostics

The TAKUME Cam is particularly suitable for applications in which High-resolution imaging and precise wavefront measurement must be combined.

 

Comparison of the Silios wavefront cameras:

 

Model spectral range Main strength Sensor resolution Wavefront resolution Technology Typical applications
MAKATEA Cam 400-900 nm (visible) Very high phase sensitivity (< 1 nm RMS) 2048 x 2048 (4.2 MP) 680 x 680 QLSI (Quadriwave Lateral Shearing Interferometry) Quantitative phase microscopy, cell analysis, label-free microscopy
TIKEI Cam 400-900 nm (visible) High spatial resolution for wavefront analysis 4500 x 4500 ( 20 MP) 1500 x 1500 Micro-optical wavefront structure Microscopy, material analysis, optical system diagnostics
TAKUME SWIR Cam 900-1700 nm (SWIR) Wavefront measurement in the infrared range 1296 × 1032 (1.3 MP) 432 × 344 COLOR-SHADES® technology Metasurface measurements, nanoparticle analysis, optical metrology
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