Wavefront camera for precise phase and intensity measurement
The TIKEI Cam from Silios is a powerful wavefront imaging camera for quantitative phase imaging (QPI) and optical wavefront analysis in scientific and industrial applications.
Through the combination of a high-resolution CMOS sensors with a micro-optical wavefront structure, the camera captures Intensity and wavefront information simultaneously within a single imaging cycle. This allows optical systems and samples to be characterized precisely.
The working range of the camera is in the visible spectral range from 400-900 nm. In combination with the fine pixel structure, this enables a High spatial resolution and a precise reconstruction of the wavefront.
Thanks to the compact design and the C-/CS-mount compatibility the camera can be easily integrated into existing Microscopy or measuring systems integrate. Data is transmitted via USB 3.0, additionally a External trigger for synchronized measurement sequences.
Typical applications are
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quantitative phase microscopy (QPI)
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Cell and biosample analysis
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Material characterization
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Nanophotonics
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Optical system diagnostics
The TAKUME Cam is particularly suitable for applications in which High-resolution imaging and precise wavefront measurement must be combined.
Comparison of the Silios wavefront cameras:
| Model | spectral range | Main strength | Sensor resolution | Wavefront resolution | Technology | Typical applications |
|---|---|---|---|---|---|---|
| MAKATEA Cam | 400-900 nm (visible) | Very high phase sensitivity (< 1 nm RMS) | 2048 x 2048 (4.2 MP) | 680 x 680 | QLSI (Quadriwave Lateral Shearing Interferometry) | Quantitative phase microscopy, cell analysis, label-free microscopy |
| TIKEI Cam | 400-900 nm (visible) | High spatial resolution for wavefront analysis | 4500 x 4500 ( 20 MP) | 1500 x 1500 | Micro-optical wavefront structure | Microscopy, material analysis, optical system diagnostics |
| TAKUME SWIR Cam | 900-1700 nm (SWIR) | Wavefront measurement in the infrared range | 1296 × 1032 (1.3 MP) | 432 × 344 | COLOR-SHADES® technology | Metasurface measurements, nanoparticle analysis, optical metrology |
