Versatile precision profilometer for research and industry
The precision profilometer NanoCam HD from 4D Technology is a sophisticated measuring device for precise analysis of surface roughness. It enables non-contact measurement of surface structures with sub-Angstrom resolution and is ideal for applications in optics, semiconductor industry and materials science. Thanks to its compact design and the possibility of integration into automated systems, the NanoCam HD offers maximum flexibility for a wide range of measuring tasks.
Technical features
The precision profilometer NanoCam HD uses patented Dynamic Interferometry® technology to perform fast and precise measurements. With a vertical resolution of up to 1 Å and a measurement time of less than 100 microseconds, it delivers reliable results, even in vibration-rich environments. The integrated 5-megapixel camera with 12-bit depth and the 460 nm LED light enable detailed capture of the surface topography. The included 4Sight Focus™ software offers extensive analysis functions according to ISO 25178 and supports the evaluation of 2D and 3D surface profiles.
Application areas of the precision profilometer
The precision profilometer NanoCam HD is used in various areas of research and industry. In the optics industry it is used for quality control of lenses and mirrors. In semiconductor manufacturing, it enables the monitoring of surface roughness on wafers. It is also used in materials science to characterize surface structures. Thanks to its ability to be integrated into automated manufacturing processes, the NanoCam HD is also suitable for use in series production.
