Wavefront camera - High Res

  • Simultaneous phase and intensity measurement
  • Spectral range 400-900 nm
  • High-resolution CMOS sensor
  • Integration via C/CS mount
  • USB 3.0 + external trigger

Contact person: Mr. Zerbin

Wavefront camera for precise phase and intensity measurement

The TIKEI Cam von Silios is a powerful wavefront imaging camera for quantitative phase imaging (QPI) and optical wavefront analysis in scientific and industrial applications.

Through the combination of a high-resolution CMOS sensors with a micro-optical wavefront structure, the camera captures Intensity and wavefront information simultaneously within a single imaging cycle. This allows optical systems and samples to be characterized precisely.

The working range of the camera is in the visible spectral range from 400-900 nm. In combination with the fine pixel structure, this enables a High spatial resolution and a precise reconstruction of the wavefront.

Thanks to the compact design and the C-/CS-mount compatibility the camera can be easily integrated into existing Microscopy or measuring systems integrate. Data is transmitted via USB 3.0, additionally a External trigger for synchronized measurement sequences.

Typical applications are

  • quantitative phase microscopy (QPI)

  • Cell and biosample analysis

  • Material characterization

  • Nanophotonics

  • Optical system diagnostics

The TAKUME Cam is particularly suitable for applications in which High-resolution imaging and precise wavefront measurement must be combined.

 

Technical data

  • Spectral range: 400-900 nm

  • Sensor resolution: 5472 × 3648 pixels (20.7 MP)

  • Pixel size: approx. 2.4 µm

  • Wavefront image: approx. 1600 × 1600 pixels

  • Phase sensitivity: < 1 nm RMS

  • Bit depth: 10 bit

  • Interface: USB 3.0

  • Mounting: C- / CS-Mount

Typical applications

  • Quantitative Phase Imaging (QPI) in cell and tissue microscopy
  • High-resolution optical analysis of structures and materials
  • Nanostructure and nanophotonics investigations
  • Wavefront and phase profile measurement
  • Surface topography analyses
  • Research & development in physics, biology and materials science
  • Optical system diagnostics and calibration
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