roughness profilometer

Logo von SM

  • Contour measuring device for roughness and small profiles
  • Resolution 0.1nm
  • Meets all common standards (ISO, DIN)
  • positioning speed up to 10mm/s
  • Measuring speed 0.2mm/s – 2mm/s
  • Reports ready-made or freely designed

Contact person: Mr. Michael Zerbin

The roughness profilometer RT120 from SM Instruments enables high-precision measurements of surface roughness and profile contours. Thanks to the intuitive Profile Studio software Roughness values and geometric dimensions can be recorded and analyzed with just one measurement. The system meets modern industry standards such as ISO 4287, ISO 13565-1 and -2, ISO 12085 and VDA 2007 and calculates over 70 different roughness parameters.

Highest measurement accuracy for complex components

With a Measuring range of 120 mm in X-direction and up to 5 mm in Z-direction The RT120 enables the detection of even the smallest profile deviations. The high Z-resolution of 0.1 nm provides a detailed recording of the surface structure. In addition, the automatic CNC function a repeatable and efficient series measurement.

Flexible and ergonomic design

The roughness profilometer is equipped with a stable granite base that ensures vibration-free measurement. About the T-slot work table system Various accessories such as the 3-axis or 4-axis positioner and a precision vice for optimal component fixation. The column is software-controlled, allowing precise height adjustment.

Intuitive software for efficient evaluation

The included Profile Studio software enables a simple and comprehensive analysis of the measurement data. All functions are clearly arranged and support a quick interpretation of the results. In addition, the automatic self-comparison function Directly compare target and actual profiles, which saves time in series tests.

Reliable calibration according to international standards

The roughness profilometer RT120 is carried out by means of a software-controlled calibration according to DIN EN ISO/IEC 17025 calibrated. A calibration standard is included in delivery to ensure compliance with the measurement standards.

Technical data at a glance:

  • Measuring range: 120 mm (X-axis), 3-5 mm (Z-axis)
  • Resolution: 0.1 nm (Z) | 0.1 μm (X)
  • Measuring speed: 0.25 – 2 mm/s
  • Probe tips: diamond (60°/2 µm)
  • CNC function: Automatic measurement cycles with self-comparison
  • Software: Profile Studio with CAD functions
  • Interface: USB connection to Windows PC
  • Weight: 50 kg
  • Languages: German, English, French, Italian, Spanish, etc.

The roughness profilometer RT120 is the ideal solution for precise and standard-compliant measurements of surface structures. Thanks to state-of-the-art sensors, flexible software and high-quality workmanship, it is suitable for use in quality assurance, research and production.

Contact

Do you have any questions about roughness profilometer RT120 or do you need individual advice for your application? Please feel free to contact us – our team of experts will help you find the optimal solution for your requirements.

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