The atomic force microscope (AFM) enables high-resolution surface analysis at the nanoscale. With its precise XYZ scan range of 100×100×10 µm and noise rejection below 15 pm RMS, the NTEGRA II AFM delivers precise measurements for even the most demanding applications.
Thanks to the closed-loop control sensors with low noise (XY < 0.2 nm, Z < 0.04 nm) Even the smallest topographical and mechanical properties can be investigated. In addition, the low thermal drift (< 0.02 nm/min) measurement deviations, which guarantees long-term stability.
Versatile measurement modes for different requirements
Whether in research or industry – the AFM NTEGRA II offers numerous measurement modes that can be adapted automatically. These include piezoresponse measurements, electromechanical analyses, and scanning ion conductance microscopy (SICM). Integration with inverted light microscopes (Nikon, Olympus, Zeiss, Leica) is also possible.
For even more detailed material analyses, AFM can be coupled with confocal Raman modules, enabling simultaneous AFM-Raman measurements and TERS analyses. The combination with nano-IR microscopy also expands the possibilities for chemical surface analysis.
Easy operation thanks to intelligent software
The operation of the NTEGRA II atomic force microscope is through automated software configurations and the ScanTTM technology This intelligent function automatically determines the optimal scanning parameters, thus increasing measurement efficiency.
The Atomic force microscope offers numerous technical highlights that enable precise measurements. Samples with a diameter of up to 100 mm can be analyzed, while the optical resolution is 3 µm as standard and can optionally be extended to 1 µm. Furthermore, the high scan speed of up to 10 Hz with standard probes and 25 Hz with short probes enables fast and efficient surface analysis. Furthermore, external magnetic field generators provide a field strength of up to 2000 Gauss in-plane and 500 Gauss out-of-plane, supporting a wide range of experimental applications. Furthermore, the AFM is compatible with electrochemistry cells, allowing the analysis of various catalysis systems. Heating levels of up to 300°C also enable investigations under thermal conditions. Finally, the microscope allows measurements under low vacuum down to 10⁻³ Torr, which enables even more precise results.
Perfect solution for high-precision analyses
The Atomic force microscope NTEGRA II convinces with its high-precision measuring technology, versatility and intuitive operation. It is ideal for Nanotechnology, materials research and biophysical studiesThe extensive range of modules allows measurements to be optimally adapted to specific research requirements.
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