The TAKUME camera from SILIOS Technologies is a snapshot wavefront camera for the analysis of optical systems in the short-wave infrared range (SWIR). It enables the direct recording of Wavefront images and intensity data in a single measurement process and is therefore suitable for precise optical characterization and metrology.
The camera is based on the COLOR-SHADES® technology, in which micro-optical structures are hybridized directly onto an image sensor. This method allows a compact design and fast wavefront analysis without additional optical components.
With a native sensor resolution of 1296 × 1032 pixels (1.3 MP) and a wavefront resolution of 432 × 344 pixels the TAKUME camera delivers high-resolution wavefront data for demanding applications in research and industry.
The spectral operating range of the camera is in the SWIR range from 900 to 1700 nm, This makes it particularly suitable for applications where classic visible cameras cannot be used.
Comparison of the Silios wavefront cameras:
| Model | spectral range | Main strength | Sensor resolution | Wavefront resolution | Technology | Typical applications |
|---|---|---|---|---|---|---|
| MAKATEA Cam | 400-900 nm (visible) | Very high phase sensitivity (< 1 nm RMS) | 2048 x 2048 (4.2 MP) | 680 x 680 | QLSI (Quadriwave Lateral Shearing Interferometry) | Quantitative phase microscopy, cell analysis, label-free microscopy |
| TIKEI Cam | 400-900 nm (visible) | High spatial resolution for wavefront analysis | 4500 x 4500 ( 20 MP) | 1500 x 1500 | Micro-optical wavefront structure | Microscopy, material analysis, optical system diagnostics |
| TAKUME SWIR Cam | 900-1700 nm (SWIR) | Wavefront measurement in the infrared range | 1296 × 1032 (1.3 MP) | 432 × 344 | COLOR-SHADES® technology | Metasurface measurements, nanoparticle analysis, optical metrology |
