Overview of our range of AFM systems

definition

The Atomic force microscopy (AFM) is a high-resolution scanning method for analyzing surfaces at the nanometer and micrometer scale. This technique enables the imaging of the topography of materials with atomic resolution as well as the measurement of local mechanical, electrical, and magnetic properties. Thus, scanning electron microscopy is a versatile tool for characterizing surface structures and properties.

Our scanning electron microscope 

Our portfolio includes a combined system that combines the functionalities of a scanning electron microscope (SEM) and a AFM in one instrument. This scanning electron microscope offers the advantage of allowing users to first obtain an overview of the sample surface using SEM and then examine specific areas in detail at the nanoscale. This combination enables comprehensive material characterization.

Functionality and possibilities 

The AFM is based on the scanning of a sharp tip attached to a cantilever across the sample surface. The interactions between the tip and the surface lead to a deflection of the cantilever, which is detected by a laser. The precise registration of these deflections creates a three-dimensional image of the surface topography. In addition, various operating modes of the AFM Provide information about adhesion, friction, elasticity and other material properties.

Areas of application 

The AFM is widely used in various scientific and industrial fields. In materials science, it is used to study nanomaterials, polymers, and coatings. In biology, it enables the visualization of biomolecules, cells, and tissues. In the semiconductor industry, AFM for the characterization of wafer surfaces and for defect analysis. Other fields of application include surface chemistry, pharmaceutical research, and nanotechnology.

Selection criteria 

When selecting a suitable AFM When selecting a system, the specific requirements of your application should be considered. These include the desired resolution, the measuring range, the available operating modes, and compatibility with your samples. The stability of the system and the user-friendliness of the software are also relevant factors. Our experienced team offers support in selecting the optimal AFM Systems for your research or quality control tasks.

Contact for further information about AFM

Finally, we would like to invite you to take a look at our offer of AFM systems, including our combined scanning electron microscope / AFMWe are happy to provide detailed information on each product and assist you in selecting the right instrument. Contact our experienced team for more information.