SPM and TERS measurements on graphs
Graphene, one of the most fascinating materials in nanotechnology, is therefore the focus of numerous studies and applications. From carbon nanotubes (CNT) to functionalized carbons, graphene also offers enormous potential for research and industry. In particular, SPM measurements (scanning probe microscopy) and TERS measurements (tip-enhanced Raman scattering) have established themselves as key technologies for studying graphene. In addition, these methods provide precise insights into the physical properties and structure of the material.
SPM measurements on graphene
SPM measurements on graphene are one of the most important analytical methods in nanotechnology. With a scanning probe microscope (SPM), as developed by Nanonics developed and Soliton is sold, atomic structures and material properties can be examined in detail. An SPM offers the possibility of combining AFM measurements (Atomic Force Microscopy) with other measurement methods. For example, the conductivity of a graphene transistor can be analyzed as a function of the light incidence through the NSOM tip (Near-Field Scanning Optical Microscopy).
Another exciting field of research is the interaction of matter, light and electric fields. With an NSOM tip from Nanonics, which has a light exit opening of just 50 nm, substrates can be specifically illuminated. The electric fields generated can be measured using Electrical Force Microscopy (EFM) or the Kelvin method. This combination of methods opens up new possibilities for characterizing graphene.
TERS measurements on graphene
TERS measurements (Tip-Enhanced Raman Scattering) offer an innovative method for analyzing graphene, especially for determining single-layer and multi-layer structures. The number of layers has a significant influence on the physical properties of the material. While conventional Raman spectroscopy equipment illuminates larger volume areas (approx. 1 µm x 1 µm x 2 µm), TERS allows a significant reduction in the laterally illuminated area and the penetration depth. This allows the purity, structure and number of layers of graphene to be determined extremely precisely.
TERS has therefore become an indispensable tool, especially for applications on special substrates or when combining graphene with other support materials. In addition, as recently demonstrated by Nanonics, TERS enables the analysis of graphene layers with impressive accuracy. In addition, this method is increasingly used in research groups that focus on material development and quality control.
Conclusion
SPM and TERS measurements on graphs therefore provide indispensable insights into the structure and properties of this innovative material. Technologies such as Nanonics' NSOM and AFM tips can be used to study specific properties of graphene that would otherwise be inaccessible using conventional methods. These techniques are also essential for the development of new applications and materials in nanotechnology.
