{"id":6251,"date":"2023-08-09T15:34:31","date_gmt":"2023-08-09T13:34:31","guid":{"rendered":"https:\/\/soliton-gmbh.de\/?post_type=product&p=6251"},"modified":"2026-09-09T16:40:15","modified_gmt":"2026-09-09T14:40:15","slug":"laser-line-width-analyzer","status":"publish","type":"product","link":"https:\/\/soliton-gmbh.de\/en\/produkt\/laserlinienbreite-analysator\/","title":{"rendered":"OE4000 \u2013 Laser Line Width and Phase Noise Analyzer"},"content":{"rendered":"

OE4000 \u2013 Multifunctional characterization of low-noise laser sources<\/h2>\n

The OE4000 HI-Q\u00ae Multifunctional Laser Noise Analyzer by OEwaves<\/strong> enables the high-precision characterization of CW laser sources with regard to Laser linewidth, phase and frequency noise, relative intensity noise (RIN), and frequency stability<\/strong>. This makes it possible to investigate the central spectral and temporal properties of modern narrowband lasers using a single measurement system.<\/p>\n

The OE4000 was specially developed for applications where high coherence, narrow linewidth, and low laser noise are critical. The fully automated measurement enables fast and reproducible characterization in research and development as well as in demanding test and measurement tasks.<\/p>\n

Homodyne measurement method without reference laser<\/h2>\n

The OE4000 uses a homodyne measurement method<\/strong> for the analysis of extremely low phase noise of CW laser sources. A major advantage of this method is that no additional low-noise reference laser source<\/strong> is required.<\/p>\n

This significantly reduces the experimental effort and also allows laser sources with very narrow linewidths to be conveniently characterized. The evaluation includes both the both the intrinsic and the effective FWHM line width<\/strong>.<\/p>\n

Comprehensive analysis of laser noise<\/h2>\n

In addition to classical line width measurement, the OE4000 enables a much more comprehensive analysis of the laser source. The system can Phase and frequency noise, relative intensity noise, and frequency stability<\/strong> capture and thereby provide important metrics for evaluating highly stable laser sources.<\/p>\n

With a frequency resolution of 0.1 Hz to 200 kHz<\/strong> and a noise floor of -160 dBc\/Hz at frequencies above 1 MHz<\/strong> the system is suitable for the investigation of particularly low-noise CW lasers.<\/p>\n

Wide wavelength range<\/h2>\n

The OE4000 is available in several configurations for Wavelength ranges between 400 and 2200 nm<\/strong> available. This allows a wide variety of laser sources from the visible to the near-infrared spectral range to be characterized.<\/p>\n

The compact 3U 19-inch rack system<\/strong> can be controlled via USB or RS-232 and can also be operated remotely. The combination of automated measurement and user-friendly operation facilitates both individual characterization measurements and use in recurring test procedures.<\/p>\n

Typical applications<\/h2>\n

The OE4000 is particularly suitable for applications where the spectral purity and stability of a laser source are critical:<\/p>\n