{"id":5745,"date":"2023-04-19T13:39:18","date_gmt":"2023-04-19T11:39:18","guid":{"rendered":"https:\/\/soliton.selectcode.io\/?post_type=product&#038;p=5745"},"modified":"2026-08-19T15:07:24","modified_gmt":"2026-08-19T13:07:24","slug":"nanocam","status":"publish","type":"product","link":"https:\/\/soliton-gmbh.de\/en\/produkt\/nanocam\/","title":{"rendered":"NanoCam HD \u2013 Dynamic Surface Profilometer"},"content":{"rendered":"<h1 class=\"PDq2pG_selectionAnchorContainer\" data-section-id=\"6o02a5\" data-start=\"933\" data-end=\"983\">NanoCam HD \u2013 High-Precision 3D Surface Measurement<\/h1>\n<p data-start=\"985\" data-end=\"1382\">The <strong data-start=\"989\" data-end=\"1021\">NanoCam HD by 4D Technology<\/strong> is a non-contact optical surface profilometer for high-precision measurement of surface shape, texture, and roughness. The system combines a large measurement area with high vertical resolution, making it particularly suitable for applications where larger optical or technical surfaces need to be characterized quickly and reproducibly.<\/p>\n<p data-start=\"1384\" data-end=\"1606\">Unlike tactile measurement methods, the acquisition is completely non-contact. Sensitive, coated, or high-precision surfaces can thus be inspected without mechanically influencing the component.<\/p>\n<h3 data-section-id=\"3innyj\" data-start=\"1608\" data-end=\"1674\">Dynamic Interferometry\u00ae for vibration-insensitive measurements<\/h3>\n<p data-start=\"1676\" data-end=\"1953\">At the heart of the NanoCam HD is the patented <strong data-start=\"1721\" data-end=\"1778\">Dynamic Interferometry\u00ae Technology from 4D Technology<\/strong>. The phase information required for a complete surface measurement is captured simultaneously instead of requiring multiple sequential exposures.<\/p>\n<p data-start=\"1955\" data-end=\"2150\">A measurement can thereby be done in less than <strong data-start=\"1996\" data-end=\"2017\">100 microseconds<\/strong> take place. Vibrations, air currents, and other environmental influences have significantly less time to affect the measurement result.<\/p>\n<p data-start=\"2152\" data-end=\"2350\">Therefore, the NanoCam HD can also be used outside of a traditional vibration-isolated measurement laboratory \u2013 for example, directly in production environments or in automated testing stations.<\/p>\n<h3 data-section-id=\"1clntop\" data-start=\"2352\" data-end=\"2402\">surface roughness down to the angstrom range<\/h3>\n<p data-start=\"2404\" data-end=\"2704\">With a vertical resolution up to <strong data-start=\"2439\" data-end=\"2446\">1 \u00c5<\/strong> the NanoCam HD enables the quantitative analysis of very small surface structures. In addition to classic roughness measurement, three-dimensional surface topographies can be captured and different areas of a surface can be compared with one another.<\/p>\n<p data-start=\"2706\" data-end=\"2874\">The evaluation supports surface parameters according to <strong data-start=\"2760\" data-end=\"2773\">ISO 25178<\/strong> and thus enables a standardized quantitative characterization of the measured surfaces.<\/p>\n<h3 data-section-id=\"1nb7sn8\" data-start=\"2876\" data-end=\"2926\">Large-area measurement without mechanical scanning<\/h3>\n<p data-start=\"2928\" data-end=\"3149\">A special strength of the NanoCam HD is the combination of high vertical resolution and a comparatively large measurement field. This allows larger areas of a surface to be captured in a single measurement.<\/p>\n<p data-start=\"3151\" data-end=\"3367\">This reduces the effort compared to methods in which a surface has to be scanned point by point or line by line, making the system particularly attractive for fast inspection and quality control tasks.<\/p>\n<h3 data-section-id=\"1o3ot0v\" data-start=\"3369\" data-end=\"3393\">Typical applications<\/h3>\n<ul data-start=\"3395\" data-end=\"3809\">\n<li data-section-id=\"d8gt1c\" data-start=\"3395\" data-end=\"3434\">Roughness measurement of optical surfaces<\/li>\n<li data-section-id=\"1et874s\" data-start=\"3435\" data-end=\"3465\"><strong data-start=\"3437\" data-end=\"3465\">3D surface topography<\/strong><\/li>\n<li data-section-id=\"1tnavzh\" data-start=\"3466\" data-end=\"3510\">Quality control of lenses and mirrors<\/li>\n<li data-section-id=\"nb9023\" data-start=\"3511\" data-end=\"3570\">Characterization of polished and coated surfaces<\/li>\n<li data-section-id=\"1jnhz6\" data-start=\"3571\" data-end=\"3621\">Testing of large and segmented telescope optics<\/li>\n<li data-section-id=\"ohtcf\" data-start=\"3622\" data-end=\"3655\">Semiconductor and wafer inspection<\/li>\n<li data-section-id=\"1e2rr9n\" data-start=\"3656\" data-end=\"3696\">Precision optics and optical manufacturing<\/li>\n<li data-section-id=\"84khop\" data-start=\"3697\" data-end=\"3744\">Materials Science and Surface Engineering<\/li>\n<li data-section-id=\"h9j5ei\" data-start=\"3745\" data-end=\"3778\">Production-related process control<\/li>\n<li data-section-id=\"194zzvs\" data-start=\"3779\" data-end=\"3809\">Automated serial testing<\/li>\n<\/ul>\n<h3 data-section-id=\"1bwf35v\" data-start=\"3811\" data-end=\"3838\">Advantages of the NanoCam HD<\/h3>\n<ul data-start=\"3840\" data-end=\"4233\">\n<li data-section-id=\"367tvu\" data-start=\"3840\" data-end=\"3873\">Non-contact optical measurement<\/li>\n<li data-section-id=\"1u9t2zg\" data-start=\"3874\" data-end=\"3907\"><strong data-start=\"3876\" data-end=\"3907\">Vertical resolution up to 1 \u00c5<\/strong><\/li>\n<li data-section-id=\"13i2lkd\" data-start=\"3908\" data-end=\"3931\">Measurement time under 100 \u00b5s<\/li>\n<li data-section-id=\"1gfueh3\" data-start=\"3932\" data-end=\"3978\">High insensitivity to vibrations<\/li>\n<li data-section-id=\"n7l2l5\" data-start=\"3979\" data-end=\"4015\">Large-area 3D surface measurement<\/li>\n<li data-section-id=\"igactp\" data-start=\"4016\" data-end=\"4046\">Quantitative roughness analysis<\/li>\n<li data-section-id=\"1y9vu2n\" data-start=\"4047\" data-end=\"4075\">Analysis according to ISO 25178<\/li>\n<li data-section-id=\"1e6bdrv\" data-start=\"4076\" data-end=\"4119\">Suitable for laboratory and manufacturing environments<\/li>\n<li data-section-id=\"19bh7lg\" data-start=\"4120\" data-end=\"4171\">Integration into automated measurement processes possible<\/li>\n<li data-section-id=\"167njee\" data-start=\"4172\" data-end=\"4233\">Measurement of sensitive surfaces without mechanical contact<\/li>\n<\/ul>\n<h3 data-section-id=\"1os3db6\" data-start=\"4235\" data-end=\"4267\">Analysis with 4Sight\u2122 Focus<\/h3>\n<p data-start=\"4269\" data-end=\"4528\">The measurement data are using the <strong data-start=\"4298\" data-end=\"4324\">4Sight\u2122 Focus Software<\/strong> captured and evaluated by 4D Technology. In addition to the three-dimensional representation of the surface topography, comprehensive analysis functions for roughness, shape, and surface structure are available.<\/p>\n<p data-start=\"4530\" data-end=\"4693\">This allows measurement data to be used for detailed development analyses as well as for reproducible quality controls and automated testing procedures.<\/p>\n<h3 data-section-id=\"9f805o\" data-start=\"4695\" data-end=\"4709\">Manufacturer<\/h3>\n<p data-start=\"4711\" data-end=\"5072\"><strong data-start=\"4711\" data-end=\"4728\">4D Technology<\/strong> develops interferometric measurement systems for the high-precision characterization of surfaces and wavefronts. The patented Dynamic Interferometry\u00ae technology enables rapid measurements even under environmental conditions where conventional phase-shifting interferometers are impaired by vibrations or air currents.<\/p>","protected":false},"excerpt":{"rendered":"<p><a href=\"https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022.png\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-5720\" src=\"https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-1024x266.png\" alt=\"4D Technology\" width=\"201\" height=\"52\" srcset=\"https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-1024x266.png 1024w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-600x156.png 600w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-1200x312.png 1200w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-300x78.png 300w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-768x200.png 768w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-1536x399.png 1536w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-2048x532.png 2048w, https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/04\/4D-Logo-2022-18x5.png 18w\" sizes=\"auto, (max-width: 201px) 100vw, 201px\" \/><\/a><\/p>\n<ul>\n<li data-section-id=\"11djdv0\" data-start=\"553\" data-end=\"609\">Contactless <strong data-start=\"570\" data-end=\"609\">3D surface and roughness measurement<\/strong><\/li>\n<li data-section-id=\"1dvp23g\" data-start=\"610\" data-end=\"643\">Vertical resolution up to <strong data-start=\"636\" data-end=\"643\">1 \u00c5<\/strong><\/li>\n<li data-section-id=\"ak5si3\" data-start=\"644\" data-end=\"685\">Patented <strong data-start=\"658\" data-end=\"685\">Dynamic Interferometry\u00ae<\/strong><\/li>\n<li data-section-id=\"1w4ss1j\" data-start=\"686\" data-end=\"721\">Measurement in less than <strong data-start=\"711\" data-end=\"721\">100 \u00b5s<\/strong><\/li>\n<li data-section-id=\"1vywx5k\" data-start=\"722\" data-end=\"779\">Insensitive to vibrations and air turbulence<\/li>\n<li data-section-id=\"15omtkr\" data-start=\"780\" data-end=\"822\">Large measuring range at high vertical resolution<\/li>\n<li data-section-id=\"sc9ykf\" data-start=\"823\" data-end=\"853\">Surface analysis according to ISO 25178<\/li>\n<li data-section-id=\"19iqy5h\" data-start=\"854\" data-end=\"914\">For laboratory, manufacturing and automated quality control<\/li>\n<\/ul>","protected":false},"featured_media":12460,"template":"","meta":{"_acf_changed":false,"_uag_custom_page_level_css":"","site-sidebar-layout":"default","site-content-layout":"default","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"default","adv-header-id-meta":"","stick-header-meta":"default","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center 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