With a noise floor of up to -161 dBc\/Hz<\/strong> allows the characterization of particularly low-noise laser sources. For applications with even higher requirements, a XRIN option with a noise floor down to \u2212166 dBc\/Hz<\/strong> available.<\/p>\n Relative Intensity Noise describes the temporal fluctuations of the optical output power of a laser relative to its mean power. Especially in highly stable laser systems for metrology, sensor technology, or coherent optical methods, this intensity noise can have a significant impact on the achievable measurement accuracy.<\/p>\n The OE4001 enables fast and reproducible determination of the RIN, making it suitable for both the development and characterization of laser sources and their quality control.<\/p>\n The OE4001 is available in various configurations for multiple wavelength bands between 400 and 2200 nm<\/strong> available. This allows a wide variety of CW laser sources from the visible spectral range to the near-infrared spectral range to be investigated.<\/p>\n Depending on the configuration, measurement bandwidths of 100 MHz to 40 GHz<\/strong> available. This allows the intensity noise to be analyzed for both conventional low-noise laser sources and demanding high-frequency applications.<\/p>\n The OE4001 is particularly suited for the characterization of low-noise laser sources in demanding optical systems. Typical application areas of the HI-Q\u00ae test and measurement systems from OEwaves include, among others:<\/p>\nAccurately characterize Relative Intensity Noise<\/h2>\n
Wide wavelength range<\/h2>\n
Typical applications<\/h2>\n
![\"\"](\"https:\/\/soliton-gmbh.de\/wp-content\/uploads\/2023\/08\/oewaves_hlogo_final_CMYK.png\")
<\/a><\/p>\n