{"id":11774,"date":"2026-03-09T16:46:46","date_gmt":"2026-03-09T15:46:46","guid":{"rendered":"https:\/\/soliton-gmbh.de\/?post_type=product&p=11774"},"modified":"2026-03-11T10:31:10","modified_gmt":"2026-03-11T09:31:10","slug":"wavefront-camera-swir","status":"publish","type":"product","link":"https:\/\/soliton-gmbh.de\/en\/produkt\/wellenfrontkamera-swir\/","title":{"rendered":"Wavefront camera - SWIR"},"content":{"rendered":"

The TAKUME camera from SILIOS Technologies<\/strong> is a snapshot wavefront camera for the analysis of optical systems in the short-wave infrared range (SWIR)<\/strong>. It enables the direct recording of Wavefront images and intensity data in a single measurement process<\/strong> and is therefore suitable for precise optical characterization and metrology.<\/p>\n

The camera is based on the COLOR-SHADES\u00ae technology<\/strong>, in which micro-optical structures are hybridized directly onto an image sensor. This method allows a compact design and fast wavefront analysis without additional optical components.<\/p>\n

With a native sensor resolution of 1296 \u00d7 1032 pixels (1.3 MP)<\/strong> and a wavefront resolution of 432 \u00d7 344 pixels<\/strong> the TAKUME camera delivers high-resolution wavefront data for demanding applications in research and industry.<\/p>\n

The spectral operating range of the camera is in the SWIR range from 900 to 1700 nm<\/strong>, This makes it particularly suitable for applications where classic visible cameras cannot be used.<\/p>\n

Comparison of the Silios wavefront cameras:<\/h4>\n

 <\/p>\n\n\n\n\n\n\n\n
Model<\/th>\nspectral range<\/th>\nMain strength<\/th>\nSensor resolution<\/th>\nWavefront resolution<\/th>\nTechnology<\/th>\nTypical applications<\/th>\n<\/tr>\n<\/thead>\n
MAKATEA Cam<\/strong><\/td>\n400-900 nm (visible)<\/td>\nVery high phase sensitivity (< 1 nm RMS)<\/td>\n2048 x 2048 (4.2 MP)<\/td>\n680 x 680<\/td>\nQLSI (Quadriwave Lateral Shearing Interferometry)<\/td>\nQuantitative phase microscopy, cell analysis, label-free microscopy<\/td>\n<\/tr>\n
TIKEI Cam<\/strong><\/td>\n400-900 nm (visible)<\/td>\nHigh spatial resolution for wavefront analysis<\/td>\n4500 x 4500 ( 20 MP)<\/td>\n1500 x 1500<\/td>\nMicro-optical wavefront structure<\/td>\nMicroscopy, material analysis, optical system diagnostics<\/td>\n<\/tr>\n
TAKUME SWIR Cam<\/strong><\/td>\n900-1700 nm (SWIR)<\/td>\nWavefront measurement in the infrared range<\/td>\n1296 \u00d7 1032 (1.3 MP)<\/td>\n432 \u00d7 344<\/td>\nCOLOR-SHADES\u00ae technology<\/td>\nMetasurface measurements, nanoparticle analysis, optical metrology<\/td>\n<\/tr>\n<\/tbody>\n<\/table>","protected":false},"excerpt":{"rendered":"

\"\"<\/a><\/p>\n