confocal microscope for material analysis

  • 1p or 2p confocal images
  • FLIM in the frequency domain or in TCSPC
  • phosphorescence lifetime imaging (PLIM)
  • polarization images

Contact person: Wolf Wagner (Ph.D.)

The Confocal microscope for material analysis PL1 was specifically developed for materials science and offers the highest sensitivity down to the single-molecule level. It enables quantitative imaging and analysis of materials such as semiconductors, solar cells, and crystals. The system delivers a spatial resolution of up to 250 nm and a spectroscopic resolution of 0.05 nm, allowing even the finest material structures to be precisely investigated.

Thanks to a wide excitation wavelength range from 266 nm to 1000 nm, the PL1 is suitable for a wide range of photoluminescence characterization applications. Furthermore, the microscope offers large-area scanning capability of up to 100 mm², allowing for efficient analysis of large-area samples. Finally, the modular platform allows for easy expansion with AFM and Raman spectroscopy for comprehensive material analysis.

Technical highlights for maximum precision

The PL1 confocal microscope It boasts a wide range of technical features that make it a powerful tool for materials scientists. It enables lifetime measurements in the range of 100 ps to 100 ms and spectroscopic detection from 300 nm to 1700 nm. It also offers high-precision fluorescence fluctuation spectroscopy (FCS, FCCS, FLCS, PCH) for detailed analyses at the molecular level.

The integrated FastFLIM technology enables the generation of high-resolution 3D lifetime maps. Furthermore, the automatic control of apertures, filters, and shutter systems enables maximum productivity and reduced measurement time. Finally, the VistaVision software facilitates data analysis with phasor plots, FRET analyses, and spectral separation of material components.

Areas of application in research and industry

The PL1 confocal microscope for material testing is the ideal solution for a wide range of applications in materials research. It is used to investigate semiconductor materials to analyze their optical and electronic properties. It is also ideal for characterizing solar cells and photovoltaic materials to optimize their efficiency. Furthermore, it is used to analyze crystal structures and nanomaterials to precisely determine their composition and defects. Finally, chemical and biomedical research also benefit from the ability to examine material surfaces at the molecular level using fluorescence imaging.

Contact

Do you have any questions about PL1 or do you need individual advice for your application? Please feel free to contact us – our team of experts will help you find the optimal solution for your requirements.

characteristics

microscope and coupling

Frame format:

  • Upright or inverted research microscope

Enlargement:

  • 10X and 60X, oil immersion objective (standard)
  • Optional: from 2X to 100X

Spatial resolution:

  • diffraction limited

Eye observation:

  • bright field with 10X eyepiece with diopter adjustment
  • Field of view: 22 mm

Imaging modes:

  1. Transmission mode:
    • HAL-Köhler illumination for bright field images with a CMOS camera
    • Phase contrast and differential interference contrast (DIC) options
  2. Confocal photoluminescence imaging:
    • Laser illumination, single point or scan

XYZ scan of the stage:

  • Closed DC servo control circuit
  • XY axis (travel range):
    • 100 mm × 100 mm (upright)
    • 120 mm × 75 mm (inverted)
  • XY axis (performance):
    • Resolution = 22 nm
    • Maximum speed = 7 mm/s
    • RMS repeatability
  • Z-axis (performance):
    • Resolution = 50 nm
    • Maximum speed = 0.6 mm/s
    • Repeatability = 100 nm

Laser sources:

  • CW or pulsed diode lasers
  • Repetition rate up to 80 MHz (software-controlled adjustable)
  • The laser launcher can accommodate up to 3 lasers, wavelength range from 375 nm to 980 nm
  • Each laser has its own intensity control and shutter (controlled by software)

data recording unit – FastFLIM

  • Lifetime measuring range: 100 ps to 100 ms
  • Data recording modes:
    • photon counting mode
    • time-tagged mode
    • Time-resolved time-tagged mode (TTTR)
  • Dead time: 3.125 ns
  • Maximum count rate: up to 60 × 10⁶ counts per second
  • Computer connection: USB

detectors:

  • Dark count rate < 100/s
  • Temporal jitter < 350 ps
  • Wavelength range: 350 – 1050 nm
  • Quantum efficiency > 70 % at 700 nm

Scan modes:

X, XY, XZ, XYZ, t, Xt, XYt, XZt, XYZt

Image formats:

In addition to proprietary file formats containing imaging parameters, VistaVision supports export of acquired data in various formats such as:

  • JPEG, TIFF, PNG, AVI

Image processing and analysis:

  • Visualization with different lookup tables
  • Contrast adjustment, thresholding, smoothing, filtering, scaling
  • Statistical analysis using histograms or online profiling

Lifetime data analysis methods:

  1. Nonlinear least-square deconvolution fitting
    • Based on the Marquardt-Levenberg minimization algorithm
    • Application in time and frequency domain
  2. Model-free phasor plot method
    • Instant and unbiased results

Software:

  • VistaVision

Computer & Monitor:

  • high-performance processor
  • 32 GB RAM
  • Windows 11, 64-bit
  • 32″ monitor, resolution 2556 × 1440

Power supply:

  • Universal input voltage: 110 – 240 V, 50/60 Hz, 100 VAC

Measurements for PL1:

  • intensity and lifetime imaging
  • fluorescence fluctuation spectroscopy (FFS)
  • single-molecule FRET burst analysis

 

data sheet

ParalabBIO-ISS-PL1

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